| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a terahertz electromagnetic wave detection device avoiding decline of detection sensitivity of a terahertz electromagnetic wave caused by a defect (especially a slip line along (111) or the like) generated on a ZnTe monocrystal substrate as an electro-optical element, and further improving accuracy of a measured image utilizing the terahertz electromagnetic wave. <P>SOLUTION: This terahertz electromagnetic wave detection device is provided with at least: a terahertz electromagnetic wave irradiation means for irradiating a terahertz electromagnetic wave, a probe light irradiation means for irradiating probe light, the electro-optical element entered by a terahertz electromagnetic wave from the terahertz electromagnetic wave irradiation means and probe light from the probe light irradiation means, and a probe light detection means for detecting probe light (or its intensity) transmitted through the electro-optical element. As the electro-optical element, the ZnTe monocrystal substrate off-angled by 10-45°in the direction from ä110} to ä001} is used. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
