发明名称 METHOD OF FABRICATING INSULATION LAYER AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE SAME
摘要 A method for fabricating an insulation layer includes forming an insulation layer over a nitride layer using a silicon source and a phosphorus source, wherein the insulation layer includes a first insulation layer contacting the nitride layer and a second insulation layer formed on the first insulation layer, wherein the first insulation layer is formed using a higher flow rate of the silicon source and a lower flow rate of the phosphorus source than used with the second insulation layer.
申请公布号 US2010151668(A1) 申请公布日期 2010.06.17
申请号 US20080346691 申请日期 2008.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON YANG-HAN
分类号 H01L21/3205;H01L21/318;H01L21/4763 主分类号 H01L21/3205
代理机构 代理人
主权项
地址