发明名称 WAFER CARRIER WITH VARYING THERMAL RESISTANCE
摘要 In chemical vapor deposition apparatus, a wafer carrier (32) has a top surface (34) holding the wafers and a bottom surface (36) heated by radiant heat transfer from a heating element (28). The bottom surface (36) of the wafer carrier is non-planar due to features such as depressions (54) so that the wafer carrier has different thickness at different locations. The thicker portions of the wafer carrier have higher thermal resistance. Differences in thermal resistance at different locations counteract undesired non-uniformities in heat transfer to the wafer. The wafer carrier may have pockets with projections (553, 853) for engaging spaced-apart locations on the edges of the wafer.
申请公布号 WO2010024943(A3) 申请公布日期 2010.06.17
申请号 WO2009US04931 申请日期 2009.08.28
申请人 VEECO INSTRUMENTS INC.;VOLF, BORIS;SODERMAN, BREID;ARMOUR, ERIC, A. 发明人 VOLF, BORIS;SODERMAN, BREID;ARMOUR, ERIC, A.
分类号 H01L21/205;H01L21/673;H01L21/683;H01L21/687 主分类号 H01L21/205
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