发明名称 CIRCUIT FOR READING A CHARGE RETENTION ELEMENT FOR TEMPORAL MEASUREMENT
摘要 A method and a circuit for reading an electronic charge retention element for a temporal measurement, of the type including at least one capacitive element whose dielectric exhibits a leakage and a transistor with insulated control terminal for reading the residual charges, the reading circuit including; two parallel branches between two supply terminals, each branch including at least one transistor of a first type and one transistor of a second type, the transistor of the second type of one of the branches consisting of that of the element to be read and the transistor of the second type of the other branch receiving, on its control terminal, a staircase signal, the respective drains of the transistors of the first type being connected to the respective inputs of a comparator whose output provides an indication of the residual voltage in the charge retention element.
申请公布号 EP2047475(B1) 申请公布日期 2010.06.16
申请号 EP20070823618 申请日期 2007.07.20
申请人 STMICROELECTRONICS SA 发明人 LA ROSA, FRANCESCO
分类号 G11C27/00;G11C7/10 主分类号 G11C27/00
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