发明名称
摘要 <P>PROBLEM TO BE SOLVED: To provide a high-purity copper alloy ball bonding wire which has high recrystallization temperature, is easily die drawn at room temperature, has small initial ball hardness, and causes no IC chip cracking. <P>SOLUTION: The high-purity copper alloy ball bonding wire has a recrystallization temperature higher than that of high-purity copper of &ge;99.9999 mass% in purity and has reduced initial ball hardness of ball bonding by adding a fine amount of phosphorus (P) to high-purity copper of &ge;99.9999 mass% in purity. The characteristics are obtained by adding 0.5 to 15 mass ppm of phosphorus (P) to the high-purity copper of &ge;99.9999 mass% in purity and further making the total amount of other contained impurities smaller than the content of phosphorus (P). <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP4482605(B1) 申请公布日期 2010.06.16
申请号 JP20090012884 申请日期 2009.01.23
申请人 发明人
分类号 H01L21/60;C22C9/00 主分类号 H01L21/60
代理机构 代理人
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