发明名称 VERFAHREN ZUR ERKENNUNG VON DEFEKTEN ELEKTRODEN IN EINER MIKROELEKTRODENMATRIX
摘要 <p>The method involves measuring an electrochemical impedance spectrum for electrodes (1). The spectrum is modeled by an implicit non-integral frequency model in the form of a parameter matrix. Principal components analysis of the matrix is performed for transforming the matrix into a final matrix with decorrelated variables. The distance between electrode and a reference point is calculated and compared with a preset threshold distance. The electrodes with distance greater than the threshold distance classified as defective.</p>
申请公布号 AT469346(T) 申请公布日期 2010.06.15
申请号 AT20080354036T 申请日期 2008.06.10
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE - CEA 发明人 CHIBANE, ALEXANDRE;GRANGEAT, PIERRE
分类号 G01N27/403 主分类号 G01N27/403
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