发明名称 Erase discharge control method of nonvolatile semiconductor memory device
摘要 According to an example embodiment, an erase discharge method may include drawing charges accumulated in a floating gate of a floating gate type field effect transistor into a semiconductor substrate to perform an erase operation by applying a first voltage to a word line, a second voltage to an N-well and a P-well, and/or opening a bit line and a ground line. The word line may be grounded, and a discharge transistor connected to the bit line may be turned on. The N-well and the P-well may be grounded to discharge charges accumulated in the N-well and P-well.
申请公布号 US7738299(B2) 申请公布日期 2010.06.15
申请号 US20070819172 申请日期 2007.06.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KURIYAMA MASAO;HIRANO MAKOTO;MURAKAMI HIROKI;NAKAGAKI YUICHIRO
分类号 G11C11/34 主分类号 G11C11/34
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