发明名称 Plasma processing apparatus and plasma processing method
摘要 A tray 15 for a dry etching apparatus 1 has substrate accommodation holes 19A to 19D penetrating thickness direction and a substrate support portion 21 supporting an outer peripheral edge portion of a lower surface 2a of a substrate 2. A dielectric plate 23 has a tray support surface 28 supporting a lower surface of the tray 15, substrate placement portions 29A through 29D inserted from a lower surface side of the tray 15 into the substrate accommodation holes 19A through 19D and having a substrate placement surface 31 at its upper end surface for placing the substrate 2. A dc voltage applying mechanism 43 applies a dc voltage to an electrostatic attraction electrode 40. A heat conduction gas supply mechanism 45 supplies a heat conduction gas between the substrate 2 and substrate placement surface 31. The substrate 2 can be retained on the substrate placement surface 31 with high degree of adhesion. This results in that the cooling efficiency of the substrate 2 is improved and processing is uniformed at the entire region of the substrate surface including the vicinity of the outer peripheral edge.
申请公布号 US7736528(B2) 申请公布日期 2010.06.15
申请号 US20060090214 申请日期 2006.10.11
申请人 PANASONIC CORPORATION 发明人 OKITA SHOGO;ASAKURA HIROMI;WATANABE SYOUZOU;HOUCHIN RYUZOU;SUZUKI HIROYUKI
分类号 C03C15/00;C23F1/00 主分类号 C03C15/00
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