发明名称 A ATOM-MICROSCOPE USING SURFACE ANALYSIS MEASUREMENT BASED ON FLOWING RESISTANCE OF FLUID
摘要 PURPOSE: A surface analysis method of measurement based on flow resistance of fluid and an atomic force microscope using the same are provided to enable a user to easily and simply obtain topography of a sample. CONSTITUTION: A driver(140) receives a signal of compression sensor. The driver moves a stage which sample is placed in XYZ direction to operate adjustment and operate scanning interval between end part which a fluid is sprayed form a nozzle and surface of a sample. A output unit(150) displays the operation value of the driver as a brightness on a computer monitor. The output unit obtains shape of surface of the sample, roughness of a part, cross sectional view, three dimensional diagram, and all kinds of statistics.
申请公布号 KR20100064347(A) 申请公布日期 2010.06.14
申请号 KR20090119289 申请日期 2009.12.03
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 KIM, SUNG JIN;KIM, TAE YOUNG;KIM, DONG KWON
分类号 G01Q60/24;G01B13/22;G01Q60/38 主分类号 G01Q60/24
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