发明名称 |
A ATOM-MICROSCOPE USING SURFACE ANALYSIS MEASUREMENT BASED ON FLOWING RESISTANCE OF FLUID |
摘要 |
PURPOSE: A surface analysis method of measurement based on flow resistance of fluid and an atomic force microscope using the same are provided to enable a user to easily and simply obtain topography of a sample. CONSTITUTION: A driver(140) receives a signal of compression sensor. The driver moves a stage which sample is placed in XYZ direction to operate adjustment and operate scanning interval between end part which a fluid is sprayed form a nozzle and surface of a sample. A output unit(150) displays the operation value of the driver as a brightness on a computer monitor. The output unit obtains shape of surface of the sample, roughness of a part, cross sectional view, three dimensional diagram, and all kinds of statistics. |
申请公布号 |
KR20100064347(A) |
申请公布日期 |
2010.06.14 |
申请号 |
KR20090119289 |
申请日期 |
2009.12.03 |
申请人 |
KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
KIM, SUNG JIN;KIM, TAE YOUNG;KIM, DONG KWON |
分类号 |
G01Q60/24;G01B13/22;G01Q60/38 |
主分类号 |
G01Q60/24 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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