发明名称 SULFONIUM SALT, ACID GENERATOR, RESIST COMPOSITION, PHOTOMASK BLANK, AND PATTERNING PROCESS
摘要 PURPOSE: Sulfonium salt, an acid generator, a resist material using thereof, a photomask blank, and a pattern formation method using thereof are provided to supply the resist material for a chemical amplification with the suitable high-resolution, and to improve the pattern profile after developing. CONSTITUTION: Sulfonium salt is marked with chemical formula 1. In the chemical formula 1, R1 refers to a linear, a branched, or a cyclic monovalent hydrocarbon group with the carbon number of 1~50 except for a vinyl group and an isoprophenyl group. R2, R3 and R4 are a substituted or non-substituted linear or branched alkyl group with the carbon number of 1~10, an alkenyl group, an oxoalkyl group, a substituted or non-substituted aryl group with the carbon number of 6~18, an aralkyl group, or an aryloxoalkyl group.
申请公布号 KR20100064343(A) 申请公布日期 2010.06.14
申请号 KR20090118849 申请日期 2009.12.03
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 OHASHI MASAKI;KINSHO TAKESHI;WATANABE SATOSHI;OHSAWA YOUICHI
分类号 C07C309/27;C07C309/12;C07C381/12;G03F7/004;G03F7/038;G03F7/039;H01L21/027 主分类号 C07C309/27
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