发明名称 A HOLDER APPARATUS FOR SPECIMEN IN SCANNING ELCTRON MICROSCOPE
摘要 PURPOSE: A specimen holder apparatus of a scanning electronic microscope is provided to enhance precision and reliability on precise analysis by controlling phase flow during observation by firmly fixing specimen and to analyze big and heavy specimen precisely and stably. CONSTITUTION: A specimen holder apparatus of a scanning electronic microscope comprises a holder support member(10), a movable guide base member, a movable jaw member(30), and a specimen fixing bolt(40). The holder support member is installed on the top of the specimen holder stage of the scanning electronic microscope. The holder support member is protruded to the top of the specimen holder stage. The movable guide base member is installed on the top of the holder support member and includes a fixed jaw member which is formed at one side of the movable guide base member. The movable jaw member is movably coupled with the movable guide base member. The movable jaw member comprises a fixture fixing the moved location. The specimen fixing bolt is coupled to the movable jaw member to be passed through the inside of the movable jaw member making contact with the specimen.
申请公布号 KR20100063840(A) 申请公布日期 2010.06.14
申请号 KR20080118788 申请日期 2008.11.27
申请人 HYUNDAI STEEL COMPANY 发明人 KIM, HAK JIN;KIM, KI BYUCK;AHN, BYUNG RYANG
分类号 G01N1/36;G01N1/00;H01J37/20 主分类号 G01N1/36
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