发明名称 POSITIVE RESIST COMPOSITION AND RESIST PATTERN FORMING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a positive resist composition which enables to form a resist pattern of good shape with small LWR and to provide a resist pattern forming method. <P>SOLUTION: The positive resist composition includes a base component (A) whose solubility in an alkali developer increases under the action of an acid and an acid generator component (B) which generates an acid upon exposure, wherein the base component (A) includes a polymeric compound (A1) having a constitutional unit (a10) derived from a hydroxystyrene and a constitutional unit (a14) represented by a structure having an acid dissociable group in a side chain, in which two ester bonds are connected by a divalent linking group. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010128371(A) 申请公布日期 2010.06.10
申请号 JP20080305365 申请日期 2008.11.28
申请人 TOKYO OHKA KOGYO CO LTD 发明人 IRIE MAKIKO;UTSUMI YOSHIYUKI
分类号 G03F7/039;C08F212/14;C08F220/28;G03F7/004;H01L21/027 主分类号 G03F7/039
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