发明名称 RETAINER RING AND CHEMOMECHANICAL POLISHING DEVICE INCLUDING SAME
摘要 <P>PROBLEM TO BE SOLVED: To keep a polishing characteristic required for polishing a wafer further long even when a groove becomes shallow by the wear of a retainer ring. <P>SOLUTION: This retainer ring includes, on a wafer polishing surface side of a retainer ring, a groove for introducing slurry into a wafer polishing surface and discharging polishing sludge to the outside from the wafer polishing surface, and the groove has a width-increased part increased in width between an opening and a bottom part of the groove. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010129863(A) 申请公布日期 2010.06.10
申请号 JP20080304496 申请日期 2008.11.28
申请人 SHARP CORP 发明人 YAMAUCHI HIROSHI
分类号 H01L21/304;B24B37/32 主分类号 H01L21/304
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