发明名称 REFRACTIVE INDEX MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a refractive index measuring apparatus capable of measuring an accurate refractive index by maximally excluding the effect of contamination. SOLUTION: The refractive index measuring apparatus includes a light source for irradiating the sample on a prism with irradiation light through a condensing lens, a photodetector for detecting the reflected light of the irradiation light and a measuring circuit for measuring the refractive index of the sample on the basis of the output of the photodetector. Such a refractive index measuring apparatus is constituted so that the image forming position of the irradiation light is provided in the vicinity of the central part of the upper bottom opening of the prism. Especially, the condensing lens is allowed to approach the prism in order to set the image forming position in the vicinity of the central part of the upper bottom opening of the prism. Only the reflected light from the central part of the prism can be used in measurement by this constitution, thereby contamination can be excluded. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010127622(A) 申请公布日期 2010.06.10
申请号 JP20080299066 申请日期 2008.11.25
申请人 KYOTO ELECTRON MFG CO LTD 发明人 KOBAYASHI YOSHIYASU;AOYAMA KAZUHIRO
分类号 G01N21/41 主分类号 G01N21/41
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