| 摘要 |
PROBLEM TO BE SOLVED: To acquire information on the interior of a scatter absorber more accurately and simply in consideration of a device function even in cases where noises are included in measured waveforms. SOLUTION: In this method of measuring a scatter absorber, pulsed light of a prescribed wavelength is caused to enter a scatter absorber which is a measuring object and a scatter absorber for reference (S01b and S02b). The pulsed light having propagated through the interior of the scatter absorber is detected to acquire light detection signals (S01c and S02c). Measured waveforms are acquired based on the detected signals (S01d and S02d). The parameters of a function indicating a theoretical waveform of the measuring object are determined so that the result of a convolution computation of the theoretical waveform of the measuring object and the measured waveform for reference equals to the result of a convolution computation of a theoretical waveform for reference and the measured waveform of the measuring object (S03). Information on the interior of the scatter absorber is calculated based on the theoretical waveforms indicated by the function (S04). COPYRIGHT: (C)2010,JPO&INPIT |
