发明名称 PROCESS FOR PRODUCTION OF SOI SUBSTRATE AND PROCESS FOR PRODUCTION OF SEMICONDUCTOR DEVICE
摘要 A process for producing an adhered SOI substrate without causing cracking and peeling of a single-crystal silicon thin film. The process consists of selectively forming a porous silicon layer in a single-crystal semiconductor substrate, adding hydrogen into the single-crystal semiconductor substrate to form a hydrogen-added layer, adhering the single-crystal semiconductor substrate to a supporting substrate, separating the single-crystal semiconductor substrate at the hydrogen-added layer by thermal annealing, performing thermal annealing again to stabilize the adhering interface, and selectively removing the porous silicon layer to give single-crystal silicon layer divided into islands.
申请公布号 US2010144111(A1) 申请公布日期 2010.06.10
申请号 US20100705994 申请日期 2010.02.16
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 FUKUNAGA TAKESHI
分类号 H01L21/762;H01L21/77;H01L21/84;H01L27/12;H01L27/146;H01L29/786 主分类号 H01L21/762
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