A SIMPLE AND STABLE REFERENCE FOR IR-DROP AND SUPPLY NOISE MEASUREMENTS
摘要
Apparatus and method for IR-drop and supply noise measurements in electronic circuits. A first voltage at a point of interest in the circuit is sampled and stored during a quiescent mode of the circuit the voltage is to be measured in. Subsequently, the circuit is brought in an operating mode and a second voltage is sampled and held at the same point of interest. The first and the second voltage are compared and a corresponding voltage signal is passed to a system output.
申请公布号
WO2010064161(A1)
申请公布日期
2010.06.10
申请号
WO2009IB55139
申请日期
2009.11.18
申请人
NXP B.V.;VEENDRICK, HENDRICUS JOSEPH MARIA;PELGROM, MARCEL;ZIEREN, VICTOR
发明人
VEENDRICK, HENDRICUS JOSEPH MARIA;PELGROM, MARCEL;ZIEREN, VICTOR