发明名称 METHOD OF MANUFACTURING GaAs SEMICONDUCTOR WAFER
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a GaAs semiconductor wafer, smoothing an uneven shape of a wafer surface by eliminating linear unevenness due to misalignment of a wire caused by a supporting base. SOLUTION: In the method of manufacturing a GaAs semiconductor wafer W, a single crystal ingot 13 of GaAs is adhered and fixed on the supporting base 14, is pressed to a travelling wire saw 10 to slice the ingot. The supporting base 14 is formed of selected material which mainly contains alumina and has hardness in a range of shore D hardness 32-36. The single crystal ingot 13 is bonded and fixed on the selected supporting base 14, is cut by the wire saw 10 from an upper part of the single crystal ingot 13, and a lower part including a part of the supporting base 14 is cut to slice the single crystal ingot 13. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010129586(A) 申请公布日期 2010.06.10
申请号 JP20080299631 申请日期 2008.11.25
申请人 HITACHI CABLE LTD 发明人 OWADA MASASHI
分类号 H01L21/304;B24B27/06;B24B41/06;B28D5/04;B28D7/04 主分类号 H01L21/304
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