| 摘要 |
<P>PROBLEM TO BE SOLVED: To easily and positively detect defects on the surface of a sphere and in the whole inside of the sphere, and to improve reliability of products and ease of operation. Ž<P>SOLUTION: A whole sphere is simultaneously inspected at high speed by simultaneously performing the steps of: transmitting ultrasonic waves to an inspection target sphere 31 from an ultrasonic probe 36 for a normal wave method disposed at a position facing the center of the inspection target sphere by rotating the inspection target sphere 31 in a meridian manner in a liquid; electrically converting received returning ultrasonic waves that propagate inside the sphere and are reflected; determining the presence of defects 0.4 mm or more distant from the sphere surface based on the level of waveform signals; and transmitting ultrasonic waves to the inspection target sphere 31 from an ultrasonic probe 37 for a surface wave method with its center line disposed at a position offset by 20-23% of the diameter of the sphere from the center line of the inspection target sphere 31, and determining the presence of surface defects and internal defects within 0.4 mm from the surface of the sphere based on the level of waveform signals obtained by electrically converting received returning waveform signals that propagate the sphere surface and the neighborhood of the sphere surface and are reflected. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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