发明名称 THIN-FILM TRANSISTOR, ELECTRO-OPTICAL DEVICE, AND ELECTRONIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To facilitate a method of manufacturing a thin-film transistor while suppressing the occurrence of an optical leak current. SOLUTION: The thin-film transistor includes: on a substrate (10), a base film (12) having a projection step (12a), extending in a first direction; on a surface, a semiconductor layer (30a) formed on the base film in a longitudinal state and in a second direction crossing the first direction, having a step corresponding to the projection step on a surface, and locally having a narrow width in a channel width direction in a region overlapping the projection step; and a gate electrode (30b) arranged opposite the semiconductor layer with a gate insulating film (13) interposed. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010129733(A) 申请公布日期 2010.06.10
申请号 JP20080302026 申请日期 2008.11.27
申请人 SEIKO EPSON CORP 发明人 EGAMI TAKASHI
分类号 H01L29/786;G02F1/1368;H01L21/336 主分类号 H01L29/786
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