发明名称 THE CAPACITORLESS DRAM AND METHOD FOR FABRICATING THEREOF
摘要 <p>PURPOSE: A capacitor-less DRAM and a method for manufacturing the same are provided to improve the hole-storage capacity due to a hole-barrier by forming a continuous germanium layers or a non-continuous dots through an ion implantation method and a heat treatment process. CONSTITUTION: A source(105), a channel, and a drain(106) are successively formed on a substrate(100). A gate insulating layer(103) is formed on the channel. A gate is formed on the gate insulating layer. A germanium layer or a germanium dot is formed in the channel. The gate insulating layer is made of a silicon oxide, a nitride film, an aluminum oxide, a hafnium oxide, or a zinc oxide.</p>
申请公布号 KR20100062502(A) 申请公布日期 2010.06.10
申请号 KR20080121159 申请日期 2008.12.02
申请人 KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY 发明人 CHOI, YANG KYU;HAN, JIN WOO;KIM, DONG HYUN;KIM, JEONG WOO;KIM, JIN SOO;SONG, MYEONG HO;OH, JEA SUB;PARK, YUN CHANG
分类号 H01L21/8242;H01L21/336;H01L27/108;H01L29/78 主分类号 H01L21/8242
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