| 摘要 |
A method for determining the coordinates K of at least one point P1 on an edge of an optical lens, wherein the lens is held by means of a retaining device 3 with the edge which is to be measured in an optical path which runs in the direction of a Y axis of an optical micrometer which measures in the direction of a Z axis, wherein the relative position between the retaining device and the micrometer is known, in which a) the lens is held with the edge to be measured in the optical path, b) a first Z coordinate Za is determined for the point P1 of the edge which is located in a position A, wherein an X coordinate Xa of the point P1 of the X coordinate corresponds to a Y-Z level of the optical path, c) a variation of the relative position between the lens and the optical path is guaranteed which is based on a pivoting movement, d) a second Z coordinate Zb is determined in the varied relative position for the point P1 of the edge in the optical path, e) on the basis of two equation systems for the point P1 in the two positions, the missing coordinates Ya and Yb and thus the position of point P1 are determined. Measuring arrangements for measuring an edge of a lens with a retaining device for the lens and with an optical micrometer which measures in the direction of a Z axis in order to generate an optical path which runs in the direction of a Y axis, within which the lens 1 can be positioned, wherein the retaining device and the optical path can be rotated relative to each other around an axis of rotation R, wherein a pivotal axis S is provided, by means of which the lens and the optical path can be pivoted relative to each other around an angle &bgr;, wherein the pivotal axis S comprises with the axis of rotation R an angle δ which is wider than 10° and less than 170°, or a second optical path is provided which runs in the direction of an M axis, within which the lens can be positioned, wherein between the M axis and the Y axis, an angle &bgr; is provided which is less than 90°.
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