发明名称 APPARATUS AND METHOD FOR APPLICATION TESTING OF EMBEDDED SYSTEM
摘要 Provided is to an apparatus for application testing of an embedded system which can cross-develop an application program installed in the embedded system regardless of the type of a target system. A virtual environment for testing the application program adopted in the target system is constructed on the basis of information inputted through a user interface and the application program is tested by configuring a virtual target system in the constructed virtual environment. According to the present invention, the application program adopted in the target system can be developed and tested without constructing a cross-development environment for each target system in an environment in which various kinds of embedded systems are developed.
申请公布号 US2010146487(A1) 申请公布日期 2010.06.10
申请号 US20090620755 申请日期 2009.11.18
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHUN INGEOL;KIM TAEHO;LIM CHAEDEOK;PARK SEUNGMIN
分类号 G06F9/44 主分类号 G06F9/44
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