发明名称 SPECTRAL SENSITIVITY CHARACTERISTIC MEASUREMENT APPARATUS AND SPECTRAL SENSITIVITY CHARACTERISTIC MEASUREMENT METHOD
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for measuring a spectral sensitivity characteristic of an image capture device such as a digital camera by implementing one image capture. SOLUTION: The spectral sensitivity characteristic measurement apparatus and method are provided, and includes: a linear light source for emitting a white light having sufficient energy over the entire wavelength region in which a spectral sensitivity characteristic measurement is implemented; a means for separating a light from the light source, and emitting a spectrum; a screen for projecting the spectrum; a means for determining a wavelength of the spectrum projected at each position on the screen; a means for determining a spectral radiation intensity at each position on the screen; and a means for calculating a spectral sensitivity of the image capture device based on a relationship among a pixel value at each pixel in an image data obtained by the image capture device as a to-be-measured object for capturing an image of the screen, the wavelength of the spectrum projected at each position on the screen imaged on each pixel, and the spectral radiation intensity at each position on the screen. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010127739(A) 申请公布日期 2010.06.10
申请号 JP20080302063 申请日期 2008.11.27
申请人 TOPPAN PRINTING CO LTD 发明人 MIYOSHI HIROKI;HASEGAWA TAKAYUKI
分类号 G01J3/46;H04N9/07;H04N101/00 主分类号 G01J3/46
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