TCC (TEST CELL CONDITIONER)'S SURROGATE CLEANING DEVICE OF PIN ELEMENT ON LOADING BOARD, OR ELECTRICAL INTERFACE RECEPTACLE, AND CLEANING METHOD

摘要

PROBLEM TO BE SOLVED: To develop a TCC's surrogate cleaning device and a cleaning method for keeping the tip of a test probe clean by cleaning pin elements of IC device or receptacles for a test chip. SOLUTION: This device includes: a main frame for testing; a plurality of trays; receptacles for chip test; and one or more pick up/placing device. A chip waiting test (an electronic element) is mounted on a tray, and a plurality of adhesion cleaning chips are mounted on the other trays. The adhesion cleaning chip includes a solid layer and an adhesive layer, in the latter, frictional matter is mixed therein. The pick up/placing device cleans oxide or miscellaneous matter attached on the receptacle by suction or friction by transferring the adhesion cleaning chip to upper position of the receptacle for the adhesion cleaning chip test. The operation efficiency is improved because of no need of disruption of facility for cleaning the test probe by etching. COPYRIGHT: (C)2010,JPO&INPIT