发明名称 MICROLENS ALIGNMENT PROCEDURES IN CMOS IMAGE SENSOR DESIGN
摘要 A method for aligning a microlens array in a sensor die to resolve non-symmetric brightness distribution and color balance of the image captured by the sensor die. The method includes performing a pre-simulation to simulate a microlens array alignment in a silicon die and to determine a shrink-factor and de-centering values, calculating the error in a real product's alignment in process and image offset, performing a post simulation based on offset calculation on the real product and re-design of the microlens alignment, and repeating the steps of calculating the error and performing the post-simulation until a satisfactory brightness distribution is obtained. The sensor die has sensor pixels, each pixel comprising a photodiode and a microlens for directing incoming light rays to the photodiode, wherein optical axis of the microlens is shifted with respect to optical axis of the photodiode by a preset amount determined by at least one iteration of alignment process.
申请公布号 US2010146477(A1) 申请公布日期 2010.06.10
申请号 US20090489147 申请日期 2009.06.22
申请人 CROSSTEK CAPITAL, LLC 发明人 FENG CHEN
分类号 G06F17/50;G06K9/62 主分类号 G06F17/50
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