发明名称
摘要 <p>When a testing system is connected to a debug port of a tape drive unit or a SCSI bus, a self-checking test for a fabricating process is executed. When the testing system is not connected, the self-checking test for normal operation is executed. And in a test of a single card, a motor test and an MR head resistance test, which are tests of a mechanical structure portion, are omitted. In addition, in a box assembling process, the test contents are suppressed to a minimum prior to adjustments to the, tape head. Furthermore, in a test program, the status of a flag or an indication corresponding to a test executed in a next step is changed.</p>
申请公布号 JP4475618(B2) 申请公布日期 2010.06.09
申请号 JP20000206526 申请日期 2000.07.07
申请人 发明人
分类号 G06F11/22;G05B23/02;G11B5/00;G11B5/008;G11B20/18;G11B27/36 主分类号 G06F11/22
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