发明名称 |
System and method for frequency offset testing |
摘要 |
Described is a system and method for frequency offset testing. The system comprises an electronic device, a first testing device providing a reference clock signal at a first frequency to the electronic device, and a second testing device receiving data from the electronic device at the first frequency and transmitting data to the electronic device at a second frequency. The second frequency is equal to a product of the first frequency and a frequency offset value.
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申请公布号 |
US7734848(B2) |
申请公布日期 |
2010.06.08 |
申请号 |
US20060595640 |
申请日期 |
2006.11.08 |
申请人 |
VERIGY (SINGAPORE) PTE. LTD. |
发明人 |
LIU JINLEI |
分类号 |
G06F3/00;G01R27/28;G01R35/00;G06F13/00;G06F15/16;G06F19/00 |
主分类号 |
G06F3/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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