发明名称 Methods of fabricating semiconductor devices and structures thereof
摘要 Methods of fabricating semiconductor devices and structures thereof are disclosed. In a preferred embodiment, a method of manufacturing a semiconductor device includes providing a semiconductor wafer, forming a first insulating material over the semiconductor wafer, and forming a plurality of first features and a plurality of second features in the first insulating material. The plurality of first features is removed, leaving an unfilled pattern in the first insulating material. The unfilled pattern in the first insulating material is filled with a second insulating material.
申请公布号 US7732315(B2) 申请公布日期 2010.06.08
申请号 US20070849535 申请日期 2007.09.04
申请人 INFINEON TECHNOLOGIES AG;SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM SUN-OO;KIM YOON-HAE
分类号 H01L21/00 主分类号 H01L21/00
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