发明名称 METHOD FOR FORMING THE RESISTANCE VARIABLE MEMORY DEVICE
摘要 <p>PURPOSE: A method for forming a resistance variable memory device is provided to reduce a manufacturing time of a variable resistance memory by forming an amorphous semiconductor layer and improving the speed of forming a diode. CONSTITUTION: In a method for forming a resistance variable memory device, an insulating layer having an opening on a substrate(100) is formed. An epilayer(130) is formed on the opening from the substrate by a first height(A1). An amorphous semiconductor layer(140) is formed on the epilayer. The amorphous semiconductor layer and the epilayer are recessed by a second height. The first height is higher than the second height.</p>
申请公布号 KR20100060891(A) 申请公布日期 2010.06.07
申请号 KR20080119681 申请日期 2008.11.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, KIL HO;OH, JAE HEE;PARK, JAE HYUN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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