发明名称 |
RESIST COMPOSITION, METHOD OF FORMING RESIST PATTERN, NOVEL COMPOUND, AND ACID GENERATOR |
摘要 |
PURPOSE: A resist composition, a novel compound used as an acid generator, and the acid generator including the compound are provided to obtain excellent solubility to a developer, to have good lithography properties and a resist pattern. CONSTITUTION: A resist composition contains a base component having solubility to an alkali developer which is varied due to the action of an acid and an acid generator component which creates the acid through exposure. The acid generator component contains an acid generator comprising a compound having a group which is marked as a chemical formula 1 on a cation part. In the chemical formula 1, R_5 is a carbonyl group, an ester bond, or an organic group having a sulfonyl group. |
申请公布号 |
KR20100061362(A) |
申请公布日期 |
2010.06.07 |
申请号 |
KR20090114474 |
申请日期 |
2009.11.25 |
申请人 |
TOKYO OHKA KOGYO CO., LTD. |
发明人 |
KAWAUE AKIYA;UTSUMI YOSHIYUKI;HADA HIDEO;SESHIMO TAKEHIRO;MATSUZAWA KENSUKE;ISHIDUKA KEITA;ENDO KOTARO |
分类号 |
G03F7/004 |
主分类号 |
G03F7/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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