发明名称 PROJECTION EXPOSURE APPARATUS, EXPOSURE METHOD, DEVICE MANUFACTURING METHOD, ILLUMINATION OPTICAL SYSTEM, AND POLARIZATION UNIT
摘要 <p>A lighting optical device and a projection aligner capable of reducing a light quantity loss when a mask is illuminated with a polarized lighting light. A lighting optical system (ILS) for illuminating a reticle (R) with a lighting light (IL) and a projection optical system for projecting the pattern image of the reticle (R) onto a wafer (W) are provided. A lighting light (IL) emitted from an exposure light source (1) in a linearly polarized state in the lighting optical system (ILS) passes through first and second double- refraction members (12, 13) having different advanced-phase-axis directions and is converted into a polarized state that is substantially linearly polarized in a circumferential direction with the optical axis as the center in an almost specific annular area, and then illuminates the reticle (R) under an annular illuminating condition after passing through a fly-eye lens (14).</p>
申请公布号 KR20100061551(A) 申请公布日期 2010.06.07
申请号 KR20107008438 申请日期 2004.10.26
申请人 NIKON CORPORATION 发明人 SHIRAISHI NAOMASA
分类号 H01L21/027;G02B19/00;G03F7/20 主分类号 H01L21/027
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