PURPOSE: A semiconductor device including a dielectric layer is provided to offer a doped harfnium dioxide layer having a high dielectric constant by including a doping atom and a tetragonal unit lattices having the ion size bigger than the ion size of a hafnium atom. CONSTITUTION: A doped hafnium oxide layer(110) is located on a substrate(100). A bottom electrode(105) is located between the doped hafnium dioxide layer and a substrate. An upper electrode(120) is located on the doped hafnium dioxide layer. The ion size of the doping atom is bigger than the ion size of the hafnium atom. The doped hafnium dioxide layer comprises the tetragonal unit lattices.
申请公布号
KR20100058905(A)
申请公布日期
2010.06.04
申请号
KR20080117490
申请日期
2008.11.25
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LIM, JAE SOON;CHO, KYU HO;CHOI, JAE HYOUNG;KIM, YOUN SOO