发明名称 |
MANUFACTURING METHOD OF PHASE CHANGE RANDOM ACCESS MEMORY DEVICE |
摘要 |
<p>PURPOSE: A method for manufacturing a phase change memory device is provided to prevent the deterioration of a device property by embedding a trench or a contact region in a limited structure without a void. CONSTITUTION: A switching element is formed on a semiconductor substrate(100). Inter-layer insulating layers(110, 125) are formed on the upper side of the switching element. A via hole which exposes a pre-set region of the semiconductor substrate is formed. A phase change layer(140a) is formed in the bottom side of the via hole. The phase change layer is re-deposited on the sidewall of the via hole. The inside of the via hole is filled with the phase change layer.</p> |
申请公布号 |
KR20100059328(A) |
申请公布日期 |
2010.06.04 |
申请号 |
KR20080118068 |
申请日期 |
2008.11.26 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHUNG, JIE WON;KIM, HYUN PHILL |
分类号 |
H01L21/8247;H01L27/115 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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