发明名称 MANUFACTURING METHOD OF PHASE CHANGE RANDOM ACCESS MEMORY DEVICE
摘要 <p>PURPOSE: A method for manufacturing a phase change memory device is provided to prevent the deterioration of a device property by embedding a trench or a contact region in a limited structure without a void. CONSTITUTION: A switching element is formed on a semiconductor substrate(100). Inter-layer insulating layers(110, 125) are formed on the upper side of the switching element. A via hole which exposes a pre-set region of the semiconductor substrate is formed. A phase change layer(140a) is formed in the bottom side of the via hole. The phase change layer is re-deposited on the sidewall of the via hole. The inside of the via hole is filled with the phase change layer.</p>
申请公布号 KR20100059328(A) 申请公布日期 2010.06.04
申请号 KR20080118068 申请日期 2008.11.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHUNG, JIE WON;KIM, HYUN PHILL
分类号 H01L21/8247;H01L27/115 主分类号 H01L21/8247
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