发明名称 ANTI-REFLECTIVE COMPOSITION AND PATTERN FORMING METHOD USING THE SAME
摘要 <p>PURPOSE: An antireflective composition and a method for forming a pattern of a semiconductor device using the same are provided to form a pattern of an antireflective film when a photoresist pattern is formed and to have no etching process for eliminating the antireflective film. CONSTITUTION: An antireflective composition includes a polymer including a repeat unit of a chemical formula 1, a polymer for optical absorption, an acid generator, a cross-linking agent, and an organic solvent. In the chemical formula 1, R_1, R_2, and R_3 are hydrogen or methyl group and R_4 is alkylene of C1-C5. The polymer for the optical absorption includes polyhydroxystyrene. The acid generator is selected from a group comprising a photoacid generator and thermal acid generator. The cross-linking agent includes melamine.</p>
申请公布号 KR20100059435(A) 申请公布日期 2010.06.04
申请号 KR20080118206 申请日期 2008.11.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 JUNG, JAE CHANG
分类号 G03F7/004 主分类号 G03F7/004
代理机构 代理人
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