发明名称 WAFER SENSING APPARATUS OF WAFER TRANSFER SYSTEM AND INTERLOCK METHOD USING THEREOF
摘要 <p>PURPOSE: A wafer sensing apparatus of a wafer transfer system and an interlocking method using the same are provided to prevent the process accident by the misalignment of the wafer in advance by sensing the number and an alignment status of a wafer held by a retainer in a transfer stage. CONSTITUTION: A sensor moving shaft(50) is located on surface a retainer fixing bar(24). The sensor moving shaft reciprocates according to the retainer fixing bar. The driving unit transfers the driving force to the sensor moving shaft. A wafer sensor(60) comprises a lighting-emitting area(61) and a photo diode(62). The wafer sensor transmits the sensitivity signal of the light.</p>
申请公布号 KR20100058869(A) 申请公布日期 2010.06.04
申请号 KR20080117435 申请日期 2008.11.25
申请人 DONGBU HITEK CO., LTD. 发明人 YOON, TAE HO
分类号 H01L21/677;H01L21/66 主分类号 H01L21/677
代理机构 代理人
主权项
地址