发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To manufacture a semiconductor device including a penetrating electrode having a high aspect ratio with a low-temperature process. <P>SOLUTION: A first electrode 3 and a second electrode 6 that are arranged on the front and rear surface sides of a semiconductor substrate 1, respectively, are electrically connected to each other by a conductive material 7 filled in a connection hole 4 and an extension portion 6a of the second electrode 6 extending into the connection hole 4. Even though the connection hole 4 has a high aspect ratio, film formation with the low-temperature process is allowed by using the conductive material 7, instead of forming the second electrode 6 up to a bottom portion of the connection hole 4. <P>COPYRIGHT: (C)2010,JPO&INPIT</p>
申请公布号 JP2010123922(A) 申请公布日期 2010.06.03
申请号 JP20090235385 申请日期 2009.10.09
申请人 CANON INC 发明人 MUTA TADAYOSHI
分类号 H01L21/3205;H01L21/28;H01L21/285;H01L21/288;H01L23/52 主分类号 H01L21/3205
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