发明名称 Resist composition, method of forming resist pattern, novel compound, and acid generator
摘要 A resist composition including a base component (A) which exhibits changed solubility in an alkali developing solution under action of acid and an acid-generator component (B) which generates acid upon exposure, the acid-generator component (B) including an acid generator (B1) containing a compound having a cation moiety represented by general formula (I) (in the formula, R5 represents an organic group having a carbonyl group, an ester bond or a sulfonyl group; and Q represents a divalent linking group).
申请公布号 US2010136478(A1) 申请公布日期 2010.06.03
申请号 US20090591639 申请日期 2009.11.25
申请人 TOKYO OHKA KOGYO CO., LTD. 发明人 KAWAUE AKIYA;UTSUMI YOSHIYUKI;HADA HIDEO;SESHIMO TAKEHIRO;MATSUZAWA KENSUKE;ISHIDUKA KEITA;ENDO KOTARO
分类号 G03F7/20;C07D327/04;C07D333/50;G03F7/004 主分类号 G03F7/20
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