发明名称 System and Method For Nano-Pantography
摘要 A method is provided for creating a plurality of substantially uniform nano-scale features in a substantially parallel manner in which an array of micro-lenses is positioned on a surface of a substrate, where each micro-lens includes a hole such that the bottom of the hole corresponds to a portion of the surface of the substrate. A flux of charged particles, e.g., a beam of positive ions of a selected element, is applied to the micro-lens array. The flux of charged particles is focused at selected focal points on the substrate surface at the bottoms of the holes of the micro-lens array. The substrate is tilted at one or more selected angles to displace the locations of the focal points across the substrate surface. By depositing material or etching the surface of the substrate, several substantially uniform nanometer sized features may be rapidly created in each hole on the surface of the substrate in a substantially parallel manner.
申请公布号 US2010132887(A2) 申请公布日期 2010.06.03
申请号 US20090435545 申请日期 2009.05.05
申请人 UNIVERSITY OF HOUSTON 发明人 DONNELLY VINCENT;ECONOMOU DEMETRE;RUCHHOEFT PAUL;XU LIN;VEMULA SRI;JAIN MANISH
分类号 C23F1/08;B05C5/02 主分类号 C23F1/08
代理机构 代理人
主权项
地址