发明名称 APPARATUS FOR ADJUSTING POSITION OF WAFER FOR AP CVD
摘要 PURPOSE: An apparatus for adjusting position of a wafer for AP CVD is provided to stabilize a range of vapor deposition thickness by automatically implementing a position adjustment of a wafer through the improved logic of a control device and compensating a wafer map. CONSTITUTION: A guard bar(11) is included in order to adhere closely an edge part of a wafer(1). A first driver(12) fixes the wafer to the guard bar and compensates a position of a wafer. A second driver(13) rotates the wafer. A rotary shaft(14) is connected to the second driver. A control device(15) transfers the position correction of the wafer and a rotating drive signal of the wafer to the first and second drivers.
申请公布号 KR20100058354(A) 申请公布日期 2010.06.03
申请号 KR20080117120 申请日期 2008.11.24
申请人 DONGBU HITEK CO., LTD. 发明人 KIM, SUK BONG
分类号 H01L21/205;H01L21/68 主分类号 H01L21/205
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