| 摘要 |
PROBLEM TO BE SOLVED: To provide an infrared inspection apparatus for black prepreg that can reduce noise caused by the texture of black prepreg and that can improve detection accuracy of subtle abnormalities such as foreign matter, resin bead, thread cast-off and fiber present in black prepreg. SOLUTION: The infrared inspection apparatus for black prepreg includes: a carrier device 2 for carrying black prepreg 10 to be inspected; an imaging device 3 that faces one surface of the black prepreg 10 and images the black prepreg 10 being carried by the carrier device 2; and an infrared light source 6 for irradiating infrared light, from the surface of the black prepreg 10 on the other side of the imaging device 3, within the imaging field 9 of the black prepreg 10 by the imaging device 3. The infrared light source 6 is disposed so that the irradiation axis 8 of the infrared light source 6 forms an angleθwith the light receiving axis 5 of the imaging device 3, and irradiates infrared light in the imaging field 9 on the black prepreg 10 in an oblique direction with respect to the light receiving axis 5 of the imaging device 3. COPYRIGHT: (C)2010,JPO&INPIT |
