发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To reduce a data gap by using a real-time trace function of an on-chip debug circuit, and heightening the compression rate of trace data. SOLUTION: This semiconductor device is provided with: a CPU; a trace circuit capable of collecting the trace data; and external terminals capable of being connected with an emulator. The trace circuit includes: a storage part (32) capable of storing the trace data; and an effective bit retrieval circuit (36) retrieving effective bits of the trace data, and making only the effective bits of the trace data be output to the emulator based on a retrieval result thereof. In data trace output, when upper bits of the data are continuation of the same number, a continuing portion thereof is masked, and only an effective bit portion is output as trace information. Because the data except the effective bits are discarded, an externally output trace amount is reduced. Accordingly, the compression rate of the trace data is heightened to reduce the data gap. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010123050(A) 申请公布日期 2010.06.03
申请号 JP20080298085 申请日期 2008.11.21
申请人 RENESAS TECHNOLOGY CORP 发明人 SHIMIZU TATEHISA
分类号 G06F11/28 主分类号 G06F11/28
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