| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for processing a probe tip, which can carry out such the taper processing that tips of a plurality of probes are ground together. Ž<P>SOLUTION: A substrate, a block and a guide plate are fixed such that the block is sandwiched between the substrate and the guide plate, and then the plurality of probes are inserted from the substrate side into holes disposed in the substrate and the guide plate. Next, rear ends of the probes are fixed to the substrate in such the state that tips of the probes project from the guide plate, and after fixing the probes, the block is removed, and the guide plate is moved downward and fixed directly to the surface of the substrate in such the state that the probes are inserted in the holes of the guide plate. Then, a jig whose height is lower than those of the probes projecting from the guide plate, is set on the surface of the substrate, and in such the state that the probe tips project above the top of the jig, a flat plate having a sandpaper attached to its surface is moved on the jig, and the probe tips are brought into contact with the sandpaper on the surface of the flat plate and ground by the sandpaper in such the state that the probes are bent, thereby carrying out the taper processing. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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