发明名称 PHOTOMASK BLANK AND PHOTOMASK BLANK MANUFACTURING METHOD, AND FOR PHOTOMASK MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a photomask blank, for improving the light fastness of a phase shift film or light-shielding film for an exposure light having a wavelength of 200 nm or less, and for improving the lifetime of the photomask. <P>SOLUTION: The method for manufacturing the photomask blank includes forming a thin film for forming a transfer pattern on a light-transmissive substrate to prepare a thin-film coated substrate and then pressing the thin-film coated substrate. The pressing process is carried out, for example, by a cold isostatic pressing method in a range of 1,000 to 10,000 atmospheric pressure. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010122409(A) 申请公布日期 2010.06.03
申请号 JP20080295142 申请日期 2008.11.19
申请人 HOYA CORP 发明人 TANABE MASARU
分类号 G03F1/32;G03F1/54;H01L21/027 主分类号 G03F1/32
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