发明名称 |
RESIST COMPOSITION, RESIST PATTERN-FORMING METHOD, NEW COMPOUND, AND ACID GENERATOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a compound suitable as an acid generator for resist compositions, to provide an acid generator consisting of the compound, to provide such a resist composition containing the acid generator, and to provide a resist pattern-forming method. <P>SOLUTION: The compound is represented by general formula (b1-15). The acid generator consists of the compound. The resist composition includes a base material component varying in solubility to an alkali developer solution by the action of an acid and the acid generator consisting of the compound. In the general formula (b1-15), at least one of R<SP>7"</SP>to R<SP>9"</SP>is a substituted aryl group substituted with a functional group represented by general formula (b15-1). <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010120923(A) |
申请公布日期 |
2010.06.03 |
申请号 |
JP20090113577 |
申请日期 |
2009.05.08 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
UTSUMI YOSHIYUKI;HANEDA HIDEO;SHIMIZU HIROAKI;NAKAMURA TAKESHI;KAWAKAMI AKINARI;SESHIMO TAKEHIRO;MATSUZAWA KENSUKE;MICHITANI KAZUSHIGE |
分类号 |
C07C381/12;C09K3/00;G03F7/004;G03F7/039;H01L21/027 |
主分类号 |
C07C381/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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