发明名称 RESIST COMPOSITION, RESIST PATTERN-FORMING METHOD, NEW COMPOUND, AND ACID GENERATOR
摘要 <P>PROBLEM TO BE SOLVED: To provide a compound suitable as an acid generator for resist compositions, to provide an acid generator consisting of the compound, to provide such a resist composition containing the acid generator, and to provide a resist pattern-forming method. <P>SOLUTION: The compound is represented by general formula (b1-15). The acid generator consists of the compound. The resist composition includes a base material component varying in solubility to an alkali developer solution by the action of an acid and the acid generator consisting of the compound. In the general formula (b1-15), at least one of R<SP>7"</SP>to R<SP>9"</SP>is a substituted aryl group substituted with a functional group represented by general formula (b15-1). <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010120923(A) 申请公布日期 2010.06.03
申请号 JP20090113577 申请日期 2009.05.08
申请人 TOKYO OHKA KOGYO CO LTD 发明人 UTSUMI YOSHIYUKI;HANEDA HIDEO;SHIMIZU HIROAKI;NAKAMURA TAKESHI;KAWAKAMI AKINARI;SESHIMO TAKEHIRO;MATSUZAWA KENSUKE;MICHITANI KAZUSHIGE
分类号 C07C381/12;C09K3/00;G03F7/004;G03F7/039;H01L21/027 主分类号 C07C381/12
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