| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor element and a semiconductor device for which reliability of the semiconductor element having a power supply electrode at a center portion can be easily tested. SOLUTION: First internal power supply electrodes 40B1, 40B2, 40B3, and 40B4 together, second internal power supply electrodes 42B1, 42B2, 42B3, and 42B4 together, and third internal power supply electrodes 44B1, 44B2, 44B3, and 44B4 are mounted on circuits (elements) having identical functions and identical structures. Further, all internal power supply electrodes mounted on those bit cells 41 are mounted on circuits (elements) having identical functions and identical structures. COPYRIGHT: (C)2010,JPO&INPIT |
