发明名称 INSULATED GATE-TYPE SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF
摘要 <P>PROBLEM TO BE SOLVED: To properly and selectively control a work function of a tantalum carbide film in an insulated gate-type semiconductor device, related to a method of manufacturing the insulated gate-type semiconductor device. Ž<P>SOLUTION: The method of manufacturing the insulated gate-type semiconductor device has steps of: forming a gate insulating film on a semiconductor substrate; carrying out the film formation of the tantalum carbide film on the gate insulating film; and performing hydrogen plasma treatment after forming a mask pattern having an aperture for exposing a part of the tantalum carbide film. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010123660(A) 申请公布日期 2010.06.03
申请号 JP20080294264 申请日期 2008.11.18
申请人 FUJITSU MICROELECTRONICS LTD 发明人 MORIZAKI YUSUKE
分类号 H01L21/8238;H01L21/28;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/8238
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