发明名称 |
INSULATED GATE-TYPE SEMICONDUCTOR DEVICE, AND MANUFACTURING METHOD THEREOF |
摘要 |
<P>PROBLEM TO BE SOLVED: To properly and selectively control a work function of a tantalum carbide film in an insulated gate-type semiconductor device, related to a method of manufacturing the insulated gate-type semiconductor device. Ž<P>SOLUTION: The method of manufacturing the insulated gate-type semiconductor device has steps of: forming a gate insulating film on a semiconductor substrate; carrying out the film formation of the tantalum carbide film on the gate insulating film; and performing hydrogen plasma treatment after forming a mask pattern having an aperture for exposing a part of the tantalum carbide film. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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申请公布号 |
JP2010123660(A) |
申请公布日期 |
2010.06.03 |
申请号 |
JP20080294264 |
申请日期 |
2008.11.18 |
申请人 |
FUJITSU MICROELECTRONICS LTD |
发明人 |
MORIZAKI YUSUKE |
分类号 |
H01L21/8238;H01L21/28;H01L27/092;H01L29/423;H01L29/49;H01L29/78 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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