发明名称 TESTING APPARATUS, SERIAL TRANSMISSION SYSTEM, PROGRAM, AND RECORDING MEDIUM
摘要 <p>A semiconductor testing apparatus provided with serial transmission units each of which transmits transmission data between a testing unit which is connected electrically with a device to be tested to test the device and a control unit which controls the testing unit. The serial transmission unit is provided with a reception reporting section and a retransmission control section. The reception reporting section transmits to the transmission side a confirmation signal to the effect that the transmission data is received, when the reception side receives the transmission data. When the confirmation signal of the transmission data is not received within a predetermined period after the transmission side transmits the transmission data, the retransmission control section controls the transmission side to retransmit the transmission data to the reception side. Therefore, the data can be transmitted and received reliably even when a data error occurs during serial transmission.</p>
申请公布号 WO2010061482(A1) 申请公布日期 2010.06.03
申请号 WO2008JP71724 申请日期 2008.11.28
申请人 ADVANTEST CORPORATION;KUMAKI, NORIO 发明人 KUMAKI, NORIO
分类号 H04L1/16 主分类号 H04L1/16
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