发明名称 MICROCIRCUIT TESTING INTERFACE HAVING KELVIN AND SIGNAL CONTACTS WITHIN A SINGLE SLOT
摘要 In a first slot of a plurality of adjacent slots in alignment with traces on a load board of a tester, first and second conductor layers, each to make electrical contact with both a load board trace and a DUT lead. Each of the first and second contacts receives force from a resilient element extending across the slots and that urges a contact point on the contact against at least one trace and a DUT lead. Insulation between said first and second contacts in the first slot electrically insulates the first and second contacts from each other within the first slot.
申请公布号 US2010134119(A1) 申请公布日期 2010.06.03
申请号 US20080521843 申请日期 2008.01.02
申请人 SHERRY JEFFREY C 发明人 SHERRY JEFFREY C.
分类号 G01R31/02 主分类号 G01R31/02
代理机构 代理人
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