| 摘要 |
<p>Disclosed is an X-ray image pickup device in which a correction function used to correct a scattered X-ray and a correction function used to correct the beam hardening can be simply and precisely determined so that the correcting operations are performed in an appropriate sequence using the correction functions thus determined to thereby increase the accuracy of the correction and improve the image quality. The scattered X-ray and the beam hardening are corrected sequentially in this order, using the scattered X-ray correction function and the beam hardening correction function, both calculated using measurement data for calculating the correction functions. The scattered X-ray correcting function approximates the data measured at varied transmission distances and quantities of scattered X-ray, for each transmission distance and correlates the correction value thus obtained with transmittance data. Upon calculation of the beam hardening correction function, data measured at varied transmission distances is converted into projection data and is linearly approximated to obtain an ideal amount of beam hardening.</p> |
